The near field probe detects electrical fields that clocked leads emit via their surface. The probe head tip is only approx. 0.5 mm wide. The integrated screening prevents interference to the measurement result from neighbouring leads.
Frequency: 30 MHz - 3 GHz
RF-B 0,3-3
detects a magnetic field, which enters the probe point vertically. It is therefore suitable for pin-point detection of RF magnetic fields, which are emitted by surfaces. For this, the probe point is applied to the surface in question. Due to its very small construction, magnetic field distributions of under 1 millimeter can be resolved on IC housings and PCB surfaces, for example. The probe enables measurement in hard-to-reach places, such as between components.
Frequency: 30 MHz - 3 GHz
RF-R 0,3 - 3
serves the high-resolution detection of spatial RF magnetic fields. The loop opening, which is marked by a white dot, is manually turned for the recognition of field orientation and intensity. If the loop opening is orthogonally permeated by the field, a maximum can be determined. The minimum can be determined by pivoting the loop opening 90°. This allows the detection of H field distribution (orientation and intensity) by guiding the probe in the vicinity of components, between and over track runs, in the pin area of ICs, on block capacitors, EMC components, etc.
Frequency: 30 MHz - 3 GHz
LF-B 3
The near field probe is designed for the detection of magnetic fields which are emitted vertically from the surfacve area of flat units. Therefore it is particularly suitable for exploring current loops. The probe enables measurement in hard-to-reach places of the circuit-board surface (e.g. between large components of on/off-controllers).
